• microPREP® PRO FEMTO

    Faster Sample Preparation for Advanced Characterization

Meet us at IMC Booth 328

microPREP® PRO FEMTO Helps Speed up Sample Preparation for APT, TEM, SEM, and Failure Analysis Workflows.

Careful specimen preparation is essential for effective microscopy and materials analysis. For advanced analytical techniques such as atom probe tomography, transmission electron microscopy, scanning electron microscopy, and failure analysis, preparing the right sample often takes considerable time and is a key part of the process.

microPREP® PRO FEMTO from 3D-Micromac enables faster specimen preparation. It combines high-precision femtosecond laser processing, advanced process control, real-time monitoring, and accurate endpoint detection to efficiently remove material while preserving sample quality for analysis.

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Overcome the Sample-Preparation Bottleneck

Researchers in advanced characterization need to balance speed, accuracy, and sample quality. Traditional preparation often takes hours, delays access to key areas, and may introduce issues that affect subsequent analysis.

microPREP® PRO FEMTO streamlines this process, offering greater speed, control, and reproducibility. In many cases, it reduces preparation times from hours to minutes, enabling labs to transition from preparation to analysis more quickly.

Meet us at IMC Booth 328

Controlled Femtosecond Laser Processing for Reliable Results

microPREP® PRO FEMTO uses high-precision femtosecond laser processing. The system efficiently removes material and gives users the control required for demanding microscopy, materials characterization, and failure analysis. Integrated real-time process monitoring provides greater visibility during preparation. Precise endpoint detection enables researchers to target regions of interest and reduces the risk of over-processing valuable samples.

Key Advantages

  • Faster preparation for many advanced characterization workflows
  • High-precision femtosecond laser material processing
  • Real-time process monitoring for greater workflow control
  • Precise endpoint detection for targeted material removal
  • Reduced risk of preparation-induced artifacts
  • Open compatibility with downstream tools and analysis systems

Flexible Sample Preparation Across Applications and Materials

Research teams now handle increasingly complex materials, structures, and device architectures. microPREP® PRO FEMTO supports diverse sample preparation needs, including cross-section analysis, delayering, and failure analysis.

The platform can be adjusted to fit specific lab requirements and applications, including challenging specimens such as multilayer structures, brittle materials, polymers, and transparent materials.

Typical Application Areas

  • Sample preparation for APT, TEM, SEM, xRM, and nano CT
  • Cross-section analysis
  • Delayering
  • Failure analysis
  • Preparation of multilayer structures
  • Preparation of brittle, polymer, and transparent materials

Vendor-Independent Compatibility With Other Lab Tools

microPREP® PRO FEMTO integrates with existing characterization workflows and is compatible with downstream tools of any vendor. Whether the next step is FIB, plasma etching, APT, TEM, SEM, or another analysis system, the platform helps labs coordinate preparation strategies and resources for each project.

This seamless workflow integration allows researchers to use femtosecond-laser preparation, which yields significant efficiency gains while maintaining flexibility for subsequent analytical steps.

SCIENTIFIC PAPERS
Meet us at IMC Booth 328

Built on 25 Years of Laser Expertise

3D-Micromac offers 25 years of laser expertise and extensive experience in advanced sample preparation. The company supports customers in semiconductors, optics, energy storage, defense, academia, R&D labs, and national institutes.

With field-proven technology, application know-how, and collaborative support, 3D-Micromac helps researchers tackle tough specimen-preparation challenges and optimize workflows for their specific materials and analysis needs.

microPREP® PRO FEMTO was developed through ongoing dialogue with customers to address their needs and requirements. This continuous exchange drives ongoing improvements to the tool’s components. Feedback from customers in science, semiconductor, power storage, and nuclear industries reflects the success of this approach.

Laser-based sample preparation with the microPREP® PRO FEMTO has helped us to overcome the main challenge of complex, time-consuming sample preparation required for APT and micromechanical testing. This advancement enables us to prepare more samples in less time, reduces FIB usage, and accelerates our research on high-performance materials.

  • Standalone femtosecond laser tool

    for ultrafast sample preparation to avoid the preparation bottle neck

  • Built-in cameras

    for easy access to the region of interest

  • Integrated cleaning unit

    for optimal debris removal without chemical contamination or cross-contamination

  • In-situ endpoint detection

    to automatically stop the laser processing after exactly the right amount of ablation

Your Next Chance to Meet 3D-Micromac

Visit 3D-Micromac at conferences to learn how microPREP® PRO FEMTO can speed up sample preparation for advanced characterization and failure analysis.

Talk to our team about your material, application, and workflow needs, and find out how femtosecond laser-based sample preparation can help you transition from preparation to analysis more quickly.

M&M — BOOTH 1118

August 2-6 | Milwaukee, WI, USA

IMC21 — BOOTH 328

August 31 – September 4 |  Liverpool, UK

ISTFA — BOOTH 624

October 4-8 | San Antonio, TX, USA,

Schedule a Meeting

Meet us at conference.

Request Your Demo

FAQ

microPREP® PRO FEMTO is used for high-precision, laser-based sample preparation for advanced characterization and failure analysis workflows, including APT, TEM, SEM, nanoCT cross-section analysis, and delayering.
No, it’s a dedicated laser sample preparation system. microPREP® PRO FEMTO is designed to handle bulk removal, thereby accelerating sample preparation without compromising sample quality and freeing your polishing and analysis tools to do what they do best.
The system combines femtosecond laser processing with intelligent process control, real-time monitoring, and endpoint detection. It frees FIB capacities and reduces the need for user intervention. For many applications, this can reduce preparation times from hours to minutes.
As a stand-alone laser-preparation tool, microPREP PRO FEMTO takes care of the bulk removal and frees your precision-polishing tool – whether it be FIB, BIB, or plasma etching – for its dedicated purpose, the final precision work. microPREP PRO FEMTO can prepare multiple samples in a row in a short amount of time and thereby feed multiple polishing tools. With integrated tools, FIB-laser tools, on the other hand, can only use the laser and ion beam one after the other, so that both components block each other’s availability.
microPREP PRO FEMTO supports a range of challenging specimens, including multilayer structures, brittle materials, polymers, transparent materials, and other application-specific materials. Almost all materials can be prepared with the tool.
Yes. The platform is openly compatible with downstream tools and workflows, including FIB, plasma etching, APT, TEM, SEM, and other analysis and polishing systems of any vendor.
The system is relevant to researchers, failure-analysis teams, microscopy laboratories, R&D institutes, and industrial users who need faster, more controlled, and higher-quality specimen preparation for advanced characterization. Even small-scale production and prototyping are possible use cases.

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